Design For Test
About This Manual
This Design for Testability Reference Guide provides information on
developing test strategies for ASIC designs.
The following list summarizes the chapters of this ASIC document.
How to Use This Manual
The chapter highlights are presented in the following text.
Chapter 1 Introduction to Design for Testability
Introduces the subjects of designing for testability in the beginning of the
design process, fault simulation, and dc parametric testing
Chapter 2 Reasons for Using Design for Testability
Discusses the time and money savings achieved by using and integrating
design for testability (DFT) early in your design process. Discusses fault
grading and fault coverage.
Chapter 3 Developing a Testability Strategy
Presents strategies for developing testability techniques
Chapter 4 Test Pattern Requirements
Presents the required and optional TDL pattern types
Chapter 5 Ad Hoc Testability Practices
Recommends some work-arounds and techniques that are useful for
improving your testability
iv Design for Testability
How to Use This Manual
Chapter 6 Structured Testability Practices
Discusses the different types of scan design testing
Chapter 7 IEEE Standard 1149.1-1990
Provides an overview of the IEEE Std 1149.1 and gives an overview of the
boundary-scan architecture
Chapter 8 Generic Test Access Port
Discusses the generic test access port (GTAP), which is used to enable and
disable various DFT features
Chapter 9 Parallel Module Test
Presents information on parallel module test (PMT), how to use PMT with
MegaModules, such as howto test buses and hook up test buses to device pins
Chapter 10 Parametric Measurements
Discusses using parametric testing to guarantee conformance to electrical
data sheets and presents information on the use of boundary-scan, pattern
sets, and TDL types
Chapter 11 Automatic Test Pattern Generation
Presents automatic test pattern generation (ATPG) methodologies, such as
path sensitization and full and partial scan
Chapter 12 Test Pattern Generation
Discusses generating test patterns for use by automated test equipment (ATE)
Chapter 13 IEEE Standard 1149.1-Based dc Parametric Testing
Discusses what is required in performing IEEE Standard 1149.1-based dc
parametric testing
Chapter 14 Military ASIC
Summarizes military ASIC documents and the location of military-specific
design information
Appendix A Glossary
Contains important ASIC words, phrases, and software tools |
