Essentials.of.Electronic.Testing

ABOUT THE AUTHORS

Michael L. Bushnell is a Full Professor and a Board of Trustees Research Fellow

in the Electrical and Computer Engineering Department at Rutgers University. He

received his B.S. degree at Massachusetts Institute of Technology in 1975, and his

M.S. degree in 1983 and his PhD degree in 1986, both from Carnegie Mellon University.

He was selected in 1983 for the American Electronics Association Faculty

Development Program, he received the Outstanding Graduate Student Teaching

Award from Carnegie Mellon, and he was a Presidential Young Investigator of the

National Science Foundation of the United States. His current VLSI CAD research

interests are automatic digital, analog, and mixed-signal circuit test-pattern generation

on serial and distributed computers, delay fault built-in self-testing, fault

simulation, synthesis for testability, and low-power design. He coauthored 78 papers.

His books on VLSI CAD are Efficient Branch and Bound Search with Application

to Computer Aided Design, Neural Models and Algorithms for Digital Testing, and

Design Automation. He holds 3 patents (2 more are pending) on BIST and test

generation methods. He is an Editorial Board Member of the Journal of Electronic

Testing: Theory and Applications. He served as the Program Co-Chair of India’s

annual International Conference on VLSI Design in 1995 and 1996.

Vishwani D. Agrawal is a Distinguished Member of Technical Staff in the Computing

Sciences Research Center of Bell Labs (R&D arm of Lucent Technologies),

Murray Hill, New Jersey, and a Visiting Professor of Electrical and Computer Engineering

at Rutgers University, New Brunswick, New Jersey. He obtained his BSc

degree from the University of Allahabad, Allahabad, India, in 1960, BE (honours)

degree from the University of Roorkee, Roorkee, India, in 1964, ME degree from the

Indian Institute of Science, Bangalore, India, in 1966, and PhD degree in electrical

engineering from the University of Illinois, Urbana-Champaign, in 1971. His current

interests are testing, synthesis for testability, and parallel algorithms. He has published

over 200 papers and coauthored four books. He holds twelve U.S. patents on

testing, design for testability, and low-power design. He is the Editor-in-Chief of the

Journal of Electronic Testing: Theory and Applications and a past Editor-in-Chief

of the IEEE Design & Test of Computers magazine. He is the Consulting Editor

for the Frontiers in Electronic Testing book series of Kluwer Academic Publishers,

Boston. In 1985, he co-founded India’s annual International Conference on VLSI

Design. From 1989 to 1990, he served on the Board of Governors of the IEEE

xviii ABOUT THE AUTHORS

Computer Society, and in 1994, chaired the Fellow Selection Committee of that Society.

He is a Fellow of the IEEE, a Fellow of the IETE (India), and a Member of

the ACM. He has received five Best Paper Awards. In 1993, he received the Distinguished

Alumnus Award of the University of Illinois at Urbana-Champaign. In 1998,

he received the Harry H. Goode Memorial Award of the IEEE Computer Society for

“innovative contributions to the field of electronic testing.”