VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon)
By Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen

Publisher:   Morgan Kaufmann
Number Of Pages:   808
Publication Date:   2006-07-07
ISBN-10 / ASIN:   0123705975
ISBN-13 / EAN:   9780123705976
Binding:   Hardcover
Product Description:
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

· Most up-to-date coverage of design for testability.
· Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.
· Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
· Lecture slides and exercise solutions for all chapters are now available.
· Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.

Summary: Practical Book
Rating: 5
This is a great book for Test/DFT engineers and EDA engineers developing test tool. It gives a thorough review of lot of concepts and techniques employed in practice which cannot be found if you look at a general testing book. This also makes it an excellent resource to prepare for interviews.